Abstract
Radiation testing and qualification of complex systems is a challenging and demanding process due to the intricate interactions and dependencies among different system structures. This work presents an open-source, low-cost, compact, robust, and synchronized testing instrumentation for standardized and agile radiation testing of modern System-on-Chip (SoC) devices. The proposed instrumentation addresses the existing constraints in current SoC testing approaches based on Commercial Off-The-Shelf (COTS) hardware platforms, such as limited logging and power interfaces, lack of synchronization for acquired data and protection for overcurrent events, and poor external observability. To design and validate this instrumentation, fault models common to SoC devices are defined and demonstrated using fault injection and a neutron irradiation campaign.