Abstract
Near-field imaging experiments exist both in optics and microwaves with often different methods and theoretical supports. For millimeter waves or THz waves, techniques from both fields can be merged to identify materials at the micron scale on the surface or in near-surface volumes. The principle of such near-field vector imaging at the frequency of 60 GHz is discussed in detail here. We develop techniques for extracting vector voltages and methods for extracting the normalized near-field vector reflection on the sample. In particular, the subharmonic IQ mixer imbalance, which produced corrupted outputs either due to amplitude or phase differences, must be taken into account and compensated for to avoid any systematic errors. We provide a method to fully characterize these imperfections and to isolate the only contribution of the near-field interaction between the probe and the sample. The effects of the mechanical modulation waveform and harmonic rank used for signal acquisition are also discussed.