Résumé
We present an all-silicon source of near-infrared linearly-polarized single photons, fabricated by nanoscale positioning of a color center in a silicon-on-insulator microcavity. The color center consists of a single W center, created at a well-defined position by Si $^{+}$ion implantation through a 150 nm-diameter nanohole in a mask. A circular Bragg grating cavity resonant with the W's zero-phonon line at 1217 nm is fabricated at the same location as the nanohole. Under above-gap continuous-wave excitation, a very clean photon antibunching behavior ( $g{^2} \leq 0.06$ ) is observed over the entire power range, which highlights the absence of parasitic emitters. Purcell-enhancement of W's zero-phonon emission provides both a record-high photoluminescence count rate among Si color centers (ca$1.2 \times 10^{6}$counts/s) and apparent Debye-Waller factor around 99%. We also demonstrate the triggered emission of single photons with 93% purity under weak pulsed laser excitation. At high pulsed laser power, we reveal a detrimental effect of repumping processes, that could be mitigated using selective pumping schemes in the future. These results represent a major step towards on-demand sources of indistinguishable near-infrared single photons within silicon photonics chips.