- Title
- Circuit arrangement, a method for testing a supply voltage provided to a test circuit, and a method for repairing a voltage source
- Creators - without role
- Leonardo B. Zordan - Intel Mobile CommunicationsPatrick Girard - Test and dEpendability of microelectronic integrated SysTemsAlberto Bosio - Test and dEpendability of microelectronic integrated SysTemsNabil Badereddine - Intel Mobile Communications
- Publisher
- France
- Identifiers
- 9946615709311
- Academic Unit
- Laboratoire d'Informatique de Robotique et de Microélectronique de Mtp - LIRMM
- Language
- English
- Resource Type
- Patent
- Patent
- US20140307515
- Local Fields
- lirmm-02089895
Patent
Circuit arrangement, a method for testing a supply voltage provided to a test circuit, and a method for repairing a voltage source
15/04/2013
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