- Title
- Assist Circuits for SRAM Testing
- Creators - without role
- Nabil Badereddine - Intel Mobile CommunicationsLeonardo B. Zordan - Intel Mobile CommunicationsPatrick Girard - Test and dEpendability of microelectronic integrated SysTemsAlberto Bosio - Test and dEpendability of microelectronic integrated SysTems
- Publisher
- France
- Identifiers
- 9946615509311
- Academic Unit
- Laboratoire d'Informatique de Robotique et de Microélectronique de Mtp - LIRMM
- Language
- English
- Resource Type
- Patent
- Patent
- US9418759
- Local Fields
- lirmm-02089903
Patent
Assist Circuits for SRAM Testing
06/05/2014
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