- Title
- Adaptive Voltage Scaling Mechanism Based on Voltage Shoot Measurement
- Creators - without role
- Miroslav Valka - Test and dEpendability of microelectronic integrated SysTemsAlberto Bosio - Test and dEpendability of microelectronic integrated SysTemsPhilippe Debaud - STMicroelectronicsPatrick Girard - Test and dEpendability of microelectronic integrated SysTemsStephane Guilhot - STMicroelectronics
- Publisher
- France
- Identifiers
- 9946617909311
- Academic Unit
- Laboratoire d'Informatique de Robotique et de Microélectronique de Mtp - LIRMM
- Language
- English
- Resource Type
- Patent
- Patent
- WO2014023812A1
- Local Fields
- lirmm-02089887
Patent
Adaptive Voltage Scaling Mechanism Based on Voltage Shoot Measurement
08/08/2013
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