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Asynchronous Circuits as an Alternative for Mitigation of Long-Duration Transient Faults in Deep-Submicron Technologies
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Asynchronous Circuits as an Alternative for Mitigation of Long-Duration Transient Faults in Deep-Submicron Technologies

Rodrigo Possamai Bastos
Invited talk presented at the Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Brazil, April 1
01/04/2011
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