- Title
- An Advanced Diagnosis Flow using CustomSim for SRAMs
- Creators - without role
- Arnaud Virazel - Test and dEpendability of microelectronic integrated SysTemsTien-Phu Ho - Laboratoire de Génie Électrique de GrenobleAlberto Bosio - Test and dEpendability of microelectronic integrated SysTemsPatrick Girard - Test and dEpendability of microelectronic integrated SysTems
- Identifiers
- 9944014809311
- Academic Unit
- Laboratoire d'Informatique de Robotique et de Microélectronique de Mtp - LIRMM
- Language
- English
- Resource Type
- Other
- Local Fields
- lirmm-01718615
Other
An Advanced Diagnosis Flow using CustomSim for SRAMs
2017
Metrics
1 Record Views