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Various SEU conditions in SRAM studied by 3-D device simulation
Journal article   Peer reviewed

Various SEU conditions in SRAM studied by 3-D device simulation

K. Castellani-Coulié, J.-M. Palau, G. Hubert, M.-C. Calvet, P.E. Dodd and F. Sexton
IEEE Transactions on Nuclear Science, Vol.48(6), pp.1931-1936
12/2001
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