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Triple-Node-Upset Recovery High-Impedance-State-Insensitive and Single-Event-Transient Filtering Latch for Aerospace Applications
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Triple-Node-Upset Recovery High-Impedance-State-Insensitive and Single-Event-Transient Filtering Latch for Aerospace Applications

Aibin Yan, Zhuoyuan Lin, Yongkang Xu, Na Bai, Jie Cui, Zhengfeng Huang, Tianming Ni, Patrick Girard et Xiaoqing Wen
IEEE Transactions on Aerospace and Electronic Systems, Vol.61(4), pp.10847-10854
08/2025

Résumé

Latch design Fault tolerance Circuit reliability Data mining Digital audio players Training Logic gates Aerospace and electronic systems Postal services Transistors Delays Filtering Latches

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