Transmission electron microscopy of Ga(Sb, Bi)/GaSb quantum wells with varying Bi content and quantum well thickness

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E. Luna, O. Delorme, L. Cerutti, E. Tournié, J-B Rodriguez and A. Trampert

Semiconductor Science and Technology, Vol.33(9)

01/09/2018

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Title: Transmission electron microscopy of Ga(Sb, Bi)/GaSb quantum wells with varying Bi content and quantum well thickness
Creators - without role: E. Luna - Paul Drude Institute for Solid State Electronics
O. Delorme - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
L. Cerutti - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
E. Tournié - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
J-B Rodriguez - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
A. Trampert - Paul Drude Institute for Solid State Electronics
Publication Details: Semiconductor Science and Technology, Vol.33(9)
Identifiers: 9945386709311
Academic Unit: Institut d'Electronique et des Systèmes - IES
Language: English
Resource Type: Journal article
Local Fields: hal-02080292