Logo image
Sign in
Thickness-dependent properties of ultrathin bismuth and antimony chalcogenide films formed by physical vapor deposition and their application in thermoelectric generators
Journal article   Peer reviewed

Thickness-dependent properties of ultrathin bismuth and antimony chalcogenide films formed by physical vapor deposition and their application in thermoelectric generators

J. Andzane, A. Felsharuk, A. Sarakovskis, U. Malinovskis, E. Kauranens, Mikhael Bechelany, K.A. Niherysh, I.V. Komissarov and D. Erts
Materials today energy, Vol.19
03/2021

Abstract

Ultrathin film Narrow band gap layered semiconductor Bismuth chalcogenide Antimony telluride Thickness-dependent thermoelectric properties
url
Find in HALView

Metrics

1 Record Views

Details

Logo image