"The international VAMAS project on X-Ray reflectivity measurements for evaluation of thin films and multilayers. Preliminary results from a second Round-Robin"

Journal article

Peer reviewed

R.J. Matyi, L.E. Depero, E. Bontempi, P. Colombi, M. Jergel, M. Krumrey, T.A. Lafford, A. Lamperti, M. Meduna and A. van Der Lee

Thin Solid Films, Vol.516(4), pp.7962-7966

2008

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Title: "The international VAMAS project on X-Ray reflectivity measurements for evaluation of thin films and multilayers. Preliminary results from a second Round-Robin"
Creators - without role: R.J. Matyi - University at Albany, State University of New York
L.E. Depero - University of Brescia
E. Bontempi - University of Brescia
P. Colombi - University of Brescia
M. Jergel - Czech Academy of Sciences, Institute of Physics
M. Krumrey - Physikalisch-Technische Bundesanstalt
T.A. Lafford - Blue Earth Diagnostics
A. Lamperti - Durham University
M. Meduna - Masaryk University
A. van Der Lee - Université de Montpellier, Institut Européen des Membranes - IEM
Publication Details: Thin Solid Films, Vol.516(4), pp.7962-7966
Identifiers: 9946802609311
Academic Unit: Institut Européen des Membranes - IEM
Language: English
Resource Type: Journal article
Local Fields: hal-00332996