The Use of High Energy X-Ray Generators for TID Testing of Electronic Devices

Journal article

Peer reviewed

Vincent Girones, Jérôme Boch, Alain Carapelle, Arnaud Chapon, Tadec Maraine, Timothee Labau, Frédéric Saigné and Rubén García Alía

IEEE Transactions on Nuclear Science, pp.1-1

2023

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Title: The Use of High Energy X-Ray Generators for TID Testing of Electronic Devices
Creators - without role: Vincent Girones - Université de Montpellier
Jérôme Boch - Université de Montpellier
Alain Carapelle - Centre Spatial de Liège
Arnaud Chapon
Tadec Maraine - Université de Montpellier
Timothee Labau - Université de Montpellier
Frédéric Saigné - Université de Montpellier
Rubén García Alía - European Organization for Nuclear Research
Publication Details: IEEE Transactions on Nuclear Science, pp.1-1
Identifiers: 9940233809311
Academic Unit: Institut d'Electronique et des Systèmes - IES
Language: English
Resource Type: Journal article
Local Fields: hal-04124251