Testability improvements using E-Beam controllability: Principle and design for Electron-Beam testability

Christian Landrault; Pascal Nouet

doi:10.1016/0167-9317(95)00325-8

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Testability improvements using E-Beam controllability: Principle and design for Electron-Beam testability

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Testability improvements using E-Beam controllability: Principle and design for Electron-Beam testability

Christian Landrault et Pascal Nouet

Microelectronic engineering, Vol.31(1), pp.47-54

01/02/1996

DOI: https://doi.org/10.1016/0167-9317(95)00325-8

Résumé

A new concept for Electron-Beam Testing of Integrated Circuit (IC) is presented. The procedure involves E-Beam logical controllability and observability in order to apply test patterns and to analyze circuit response directly on the I/O of an embedded functional block. Simple and low silicon cost design for testability rules are given.

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Détails

Titre: Testability improvements using E-Beam controllability: Principle and design for Electron-Beam testability
Créateurs - sans rôle: Christian Landrault
Pascal Nouet
Détails de publication: Microelectronic engineering, Vol.31(1), pp.47-54
Éditeur: Elsevier B.V
Nombre de pages: 8
Identifiants: 99139339409311
Unité académique: Laboratoire d'Informatique de Robotique et de Microélectronique de Mtp - LIRMM
Langue: English
Type de ressource: Journal article