Résumé
In this work, we show the first steps of a systemlevel qualification methodology for a series of Commercial off-the Shelf (COTS) environment sensors subjected to Total Ionizing Dose (TID). We demonstrate a correlation between the degradation of electrical signals such as consumption current and functional failures in sensor measurements. The sensors were irradiated using high-energy X-rays and 60Co under different biasing cases in order to determine their worst-case scenario.