Spectroscopic ellipsometry study of x PbO–(1 − x )TiO 2 thin films elaborated by mixed reactive thermal co-evaporation

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A. Boulouz, A. En Naciri, F. Pascal-Delannoy, B. Sorli and L. Koutti

Journal of Physics D: Applied Physics, Vol.42(24)

24/12/2009

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Title: Spectroscopic ellipsometry study of x PbO–(1 − x )TiO 2 thin films elaborated by mixed reactive thermal co-evaporation
Creators - without role: A. Boulouz - Université Ibn Zohr
A. En Naciri - Université Paul Verlaine - Metz
F. Pascal-Delannoy - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
B. Sorli - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
L. Koutti - Université Ibn Zohr
Publication Details: Journal of Physics D: Applied Physics, Vol.42(24)
Identifiers: 9942226009311
Academic Unit: Institut d'Electronique et des Systèmes - IES
Language: English
Resource Type: Journal article
Local Fields: hal-01614854