Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory

Alexandre Louis Bosser; Viyas Gupta; Arto Javanainen; Georgios Tsiligiannis; Stephen D. Lalumondiere; Dale L. Brewe; Véronique Ferlet-Cavrois; Helmut Puchner; Heikki Kettunen; Thierry Gil; Frédéric Wrobel; Frédéric Saigné; Ari Virtanen; Luigi Dilillo

doi:10.1109/TNS.2018.2797543

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Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory

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Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory

Alexandre Louis Bosser, Viyas Gupta, Arto Javanainen, Georgios Tsiligiannis, Stephen D. Lalumondiere, Dale L. Brewe, Véronique Ferlet-Cavrois, Helmut Puchner, Heikki Kettunen, Thierry Gil, …

IEEE Transactions on Nuclear Science, Vol.65(8), pp.1708-1714

08/2018

DOI: https://doi.org/10.1109/TNS.2018.2797543

Abstract

Single-Event Effect

Single-Event Upset

SEFI

FRAM

X-ray

Heavy ion

Static test

Dynamic test

This paper identifies the failure modes of a commercial 130-nm ferroelectric random access memory. The devices were irradiated with heavy-ion and pulsed focused X-ray beams. Various failure modes are observed, which generate characteristic error patterns, affecting isolated bits, words, groups of pages, and sometimes entire regions of the memory array. The underlying mechanisms are discussed.

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Title: Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory
Creators - without role: Alexandre Louis Bosser - University of Jyväskylä
Viyas Gupta - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
Arto Javanainen - Vanderbilt University
Georgios Tsiligiannis - European Organization for Nuclear Research
Stephen D. Lalumondiere - The Aerospace Corporation
Dale L. Brewe - Argonne National Laboratory
Véronique Ferlet-Cavrois - European Space Research and Technology Centre
Helmut Puchner - Cypress Semiconductor Corporation
Heikki Kettunen - University of Jyväskylä
Thierry Gil - Université de Montpellier, Laboratoire d'Informatique de Robotique et de Microélectronique de Mtp - LIRMM
Frédéric Wrobel - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
Frédéric Saigné - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
Ari Virtanen - University of Jyväskylä
Luigi Dilillo - Université de Montpellier
Publication Details: IEEE Transactions on Nuclear Science, Vol.65(8), pp.1708-1714
Identifiers: 9947709209311
Academic Unit: Institut d'Electronique et des Systèmes - IES; Laboratoire d'Informatique de Robotique et de Microélectronique de Mtp - LIRMM
Language: English
Resource Type: Journal article
Local Fields: lirmm-02007922