Résumé
This paper presents an overview of the different methods used for sensitivity (i.e., responsivity and noise equivalent power) determination of state-of-the-art field-effect transistor-based THz detectors/sensors. We point out that the reported result may depend very much on the method used to determine the effective area of the sensor, often leading to discrepancies of up to orders of magnitude. The challenges that arise when selecting a proper method for characterisation are demonstrated using the example of a 2×7 detector array. This array utilises field-effect transistors and monolithically integrated patch antennas at 620 GHz. The directivities of the individual antennas were simulated and determined from the measured angle dependence of the rectified voltage, as a function of tilting in the E- and H-planes. Furthermore, this study shows that the experimentally determined directivity and simulations imply that the part of radiation might still propagate in the substrate, resulting in modification of the sensor effective area. Our work summarises the methods for determining sensitivity which are paving the way towards the unified scientific metrology of FET-based THz sensors, which is important for both researchers competing for records, potential users, and system designers.