Logo image
Sign in
Sensitivity and resolution in noncontact electrostatic force microscopy in the case of a constant potential
Journal article   Peer reviewed

Sensitivity and resolution in noncontact electrostatic force microscopy in the case of a constant potential

Gaëtan Lévêque, P. Cadet and R. Arinero
Physical Review B: Condensed Matter and Materials Physics (1998-2015), Vol.71(20)
05/2005
url
Find in HALView

Metrics

1 Record Views

Details

Logo image