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SEE on Different Layers of Stacked-SRAMs
Journal article   Peer reviewed

SEE on Different Layers of Stacked-SRAMs

Viyas Gupta, Alexandre Louis Bosser, Georgios Tsiligiannis, Mathias Rousselet, Ali Mohammad Zadeh, Arto Javanainen, Helmut Puchner, Ari Virtanen, Frédéric Saigné, Frédéric Wrobel, …
IEEE Transactions on Nuclear Science, Vol.62(6), pp.2673-2678
17/12/2015

Abstract

Static and dynamic mode testing 90 nm SRAM SEE rate Multiple cell upset (MCU) Radiation testing Single event upset (SEU) Stacked dice
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