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Retina for Pattern Matching in Standard O.6um CMOS Technology
Journal article   Peer reviewed

Retina for Pattern Matching in Standard O.6um CMOS Technology

Olivier Aubreton, Benaïssa Bellach, L.F.C. Lew Yan Voon, Bernard Lamalle, Patrick Gorria and Guy Cathébras
Journal of Electronic Imaging, Vol.13(3), pp.559-569
2004
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