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Reliability Analysis of Baremetal and FreeRTOS Applications on Microchip PolarFire SoC RISC-V Multiprocessors Using High-Energy Protons
Journal article   Open access   Peer reviewed

Reliability Analysis of Baremetal and FreeRTOS Applications on Microchip PolarFire SoC RISC-V Multiprocessors Using High-Energy Protons

André M P Mattos, Douglas A Santos and Luigi Dilillo
IEEE Access, Vol.13, pp.19922 - 19936
2025

Abstract

Protons RISC-V Radiation Testing Reliability Single-Event Effects Space Applications System-on-Chip Total Ionizing Dose
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https://doi.org/10.1109/access.2024.3524726View
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