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Radiation damage of mesoporous silica thin films monitored by X-ray reflectivity and scanning electron microscopy
Journal article   Peer reviewed

Radiation damage of mesoporous silica thin films monitored by X-ray reflectivity and scanning electron microscopy

Sandrine Dourdain, Xavier Deschanels, G. Toquer, C. Grygiel, I. Monnet, S Pellet-Rostaing and Agnès Grandjean
Journal of Nuclear Materials, Vol.427(1-3), pp.411-414
08/2012
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