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Quantitative analysis of the lattice reconstruction of ion-implanted SiC after visible light laser irradiation
Journal article   Peer reviewed

Quantitative analysis of the lattice reconstruction of ion-implanted SiC after visible light laser irradiation

D. J. Brink, H. Peyre and J. Camassel
Journal of Applied Physics, Vol.105(6)
2009

Abstract

aluminium annealing high-temperature effects ion implantation nitrogen radiation effects silicon compounds wide band gap semiconductors Keywords-Plus = PULSED EXCIMER-LASER INFRARED REFLECTANCE SPECTROSCOPY SILICON-CARBIDE ELECTRICAL ACTIVATION PHASE-CHANGE DAMAGE ALUMINUM AMORPHIZATION KINETICS RECRYSTALLIZATION Physics, Applied
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