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Quantitative Trait Loci Controlling Refractoriness to Plasmodium falciparum in Natural Anopheles gambiae Mosquitoes From a Malaria-Endemic Region in Western Kenya
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Quantitative Trait Loci Controlling Refractoriness to Plasmodium falciparum in Natural Anopheles gambiae Mosquitoes From a Malaria-Endemic Region in Western Kenya

David M. Menge, Daibin Zhong, Tom Guda, Louis Gouagna, John Githure, John Beier et Guiyun Yan
Genetics (Austin), Vol.173(1), pp.235-241
01/05/2006
PMID: 16510784

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