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Preparation and characterization of MOCVD bismuth telluride thin films
Journal article   Peer reviewed

Preparation and characterization of MOCVD bismuth telluride thin films

A. Boulouz, Alain Giani, F. Pascal-Delannoy, A. Foucaran and A. Boyer
Journal of Crystal Growth, Vol.194(3-4), pp.336 - 341
12/1998
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