Prediction of long-term thermal behavior of an irradiated SRAM based on isochronal annealing measurements

Journal article

Peer reviewed

Frédéric Saigné, O. Quittard, L. Dusseau, F. Joffre, C. Oudea, J. Fesquet and J. Gasiot

Microelectronics Reliability, Vol.42(3), pp.459 - 461

03/2002

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Title: Prediction of long-term thermal behavior of an irradiated SRAM based on isochronal annealing measurements
Creators - without role: Frédéric Saigné - Université de Reims Champagne-Ardenne
O. Quittard - CEA LETI
L. Dusseau - Université de Montpellier
F. Joffre - CEA LETI
C. Oudea
J. Fesquet - Université de Montpellier
J. Gasiot - Université de Montpellier
Publication Details: Microelectronics Reliability, Vol.42(3), pp.459 - 461
Identifiers: 9939054609311
Academic Unit: Université de Montpellier
Language: English
Resource Type: Journal article
Local Fields: hal-01802180