Optical and electrical characterization of thick GaSb buffer layers grown on 2 inches GaAs wafers

Journal article

Peer reviewed

F. Royo, Alain Giani, F. Pascal-Delannoy, L. Gouskov, J.P. Malzac and J. Camassel

Materials Science and Engineering: B, Vol.28(1-3), pp.169-173

12/1994

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Title: Optical and electrical characterization of thick GaSb buffer layers grown on 2 inches GaAs wafers
Creators - without role: F. Royo - Université de Montpellier
Alain Giani - Université de Montpellier
F. Pascal-Delannoy - Université de Montpellier
L. Gouskov - Université de Montpellier
J.P. Malzac - Université de Montpellier
J. Camassel - Université de Montpellier
Publication Details: Materials Science and Engineering: B, Vol.28(1-3), pp.169-173
Identifiers: 9939898209311
Academic Unit: Université de Montpellier
Language: English
Resource Type: Journal article
Local Fields: hal-02048535