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Optical Sectioning for Reflection Interference Microscopy: Quantitative Imaging at Soft Interfaces
Journal article   Peer reviewed

Optical Sectioning for Reflection Interference Microscopy: Quantitative Imaging at Soft Interfaces

Cathie Ventalon, Oksana Kirichuk, Yotam Navon, Yan Chastagnier, Laurent Heux, Ralf Richter, Lionel Bureau and Delphine Débarre
Langmuir, Vol.41(15), pp.10040-10051
04/2025
PMID: 40223518

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