- Title
- On the origin of threading dislocations during epitaxial growth of III-Sb on Si(001): A comprehensive transmission electron tomography and microscopy study
- Creators - without role
- Michael Niehle - Paul Drude Institute for Solid State ElectronicsJean-Baptiste Rodriguez - Université de Montpellier, Institut d'Electronique et des Systèmes - IESLaurent Cerutti - Université de Montpellier, Institut d'Electronique et des Systèmes - IESEric Tournié - Université de Montpellier, Institut d'Electronique et des Systèmes - IESAchim Trampert - Paul Drude Institute for Solid State Electronics
- Publication Details
- Acta Materialia, Vol.143, pp.121 - 129
- Identifiers
- 9943423109311
- Academic Unit
- Institut d'Electronique et des Systèmes - IES
- Language
- English
- Resource Type
- Journal article
- Local Fields
- hal-01754869
Journal article
On the origin of threading dislocations during epitaxial growth of III-Sb on Si(001): A comprehensive transmission electron tomography and microscopy study
Acta Materialia, Vol.143, pp.121 - 129
01/2018
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