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On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BIST
Journal article   Peer reviewed

On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BIST

Serge Bernard, Florence Azaïs, Yves Bertrand and Michel Renovell
Journal of Electronic Testing: : Theory and Applications, Vol.19(4), pp.pp. 469-479
2003
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