- Title
- Numerical simulations of electrostatic interactions between an atomic force microscopy tip and a dielectric sample in presence of buried nano-particles
- Creators - without role
- R. Arinero - Université de Montpellier, Institut d'Electronique et des Systèmes - IESC. Riedel - Université de Montpellier, Institut d'Electronique et des Systèmes - IESC. Guasch - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
- Publication Details
- Journal of Applied Physics, Vol.112(11)
- Identifiers
- 9943866009311
- Academic Unit
- Institut d'Electronique et des Systèmes - IES
- Language
- English
- Resource Type
- Journal article
- Local Fields
- hal-01633538
Journal article
Numerical simulations of electrostatic interactions between an atomic force microscopy tip and a dielectric sample in presence of buried nano-particles
Journal of Applied Physics, Vol.112(11)
12/2012
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