Number and current fluctuations in submicron semiconductor structures in ballistic and diffusive regimes

Article de revue

Luca Varani, Lino Reggiani, Tilmann Kuhn, Patrice Houlet, Tomas González et Daniel Pardo

Vuoto, Vol.22(4)

1992

Résumé

Computational Physics

Condensed Matter

Electronics

Engineering Sciences

Materials Science

Physics

1 Consultations de la notice

Titre: Number and current fluctuations in submicron semiconductor structures in ballistic and diffusive regimes
Créateurs - sans rôle: Luca Varani - CNR-INFM and Dipartimento di Fisica, Università di Modena e Reggio Emilia
Lino Reggiani - Dipartimento di Ingegneria dell’Innovazione, Universita’ di Lecce and INFM
Tilmann Kuhn
Patrice Houlet
Tomas González - Universidad de Salamanca [España] = University of Salamanca [Spain]
Daniel Pardo
Détails de publication: Vuoto, Vol.22(4)
Identifiants: 99162739409311
Unité académique: Institut d'Electronique et des Systèmes - IES
Langue: English
Type de ressource: Journal article