Logo image
Sign in
New method for electrostatic force gradient microscopy observations and Kelvin measurements under vacuum
Journal article   Peer reviewed

New method for electrostatic force gradient microscopy observations and Kelvin measurements under vacuum

L. Portes, M. Ramonda, R. Arinero and Pascal Girard
Ultramicroscopy, Vol.107(10-11), pp.1027-1032
2007

Abstract

Electrostatic force microscopy Amplitude controlled atomic force microscopy under vacuum Kelvin force gradient microscopy
url
Find in HALView

Metrics

1 Record Views

Details

Logo image