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Neutron and proton-induced single event upsets in advanced commercial fully depleted SOI SRAMs
Journal article   Peer reviewed

Neutron and proton-induced single event upsets in advanced commercial fully depleted SOI SRAMs

J. Baggio, V. Ferlet-Cavrois, D. Lambert, P. Paillet, Frédéric Wrobel, K. Hirose, H. Saito and E.W. Blackmore
IEEE Transactions on Nuclear Science, Vol.52(6), pp.2319-2325
12/2005
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