Near field imaging of a semiconductor laser by scanning probe microscopy without a photodetector

Journal article

Peer reviewed

M. Dunaevskiy, P. Alekseev, A. N. Baranov, A. M. Monakhov, R. Teissier, R. Arinero, Pascal Girard and A. N. Titkov

Applied Physics Letters, Vol.103(5)

29/07/2013

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Title: Near field imaging of a semiconductor laser by scanning probe microscopy without a photodetector
Creators - without role: M. Dunaevskiy
P. Alekseev - Saint Petersburg State Electrotechnical University
A. N. Baranov - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
A. M. Monakhov
R. Teissier - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
R. Arinero - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
Pascal Girard - Institut de Physique Nucléaire d’Orsay
A. N. Titkov
Publication Details: Applied Physics Letters, Vol.103(5)
Identifiers: 9934895209311
Academic Unit: Institut d'Electronique et des Systèmes - IES
Language: English
Resource Type: Journal article
Local Fields: hal-01621256