Nature of deep defects in bulk VHF-GD a-Si:H

Journal article

Peer reviewed

M. Favre, A. Shah, I. Hubin, Etienne Bustarret, M.A. Hachicha and Skandar Basrour

Journal of Non-Crystalline Solids, Vol.137-138 pt.1, pp.335-8

1991

Abstract

photothermal-deflection-spectra

semiconductor-

deep-defects

bulk-VHF-GD-a-Si:H

PACS 85.42

The authors report on the comparison of defect densities measured by the two techniques, ESR and PDS, on a large range of thicknesses, 500 AA

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Title: Nature of deep defects in bulk VHF-GD a-Si:H
Creators - without role: M. Favre - University of Neuchâtel
A. Shah - University of Neuchâtel
I. Hubin - Laboratoire d'Etudes des Propriétés Electroniques des Solides
Etienne Bustarret - Centre National de la Recherche Scientifique
M.A. Hachicha - Centre National de la Recherche Scientifique
Skandar Basrour - Centre National de la Recherche Scientifique
Publication Details: Journal of Non-Crystalline Solids, Vol.137-138 pt.1, pp.335-8
Identifiers: 9941187809311
Academic Unit: Université de Montpellier
Language: English
Resource Type: Journal article
Local Fields: hal-00008963