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Monte Carlo analysis of fluctuations in submicron n + nn + structures
Journal article   Peer reviewed

Monte Carlo analysis of fluctuations in submicron n + nn + structures

L. Varani, T Kuhn, L. Reggiani, Y. Perles, J. Vaissiere and J.-P. Nougier
Semiconductor Science and Technology, Vol.7(3B), pp.B552-B554
02/03/1992
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