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Monte Carlo analysis of electronic noise in semiconductor materials and devices
Journal article   Peer reviewed

Monte Carlo analysis of electronic noise in semiconductor materials and devices

L. Reggiani, P. Golinelli, L. Varani, T. Gonzalez, D. Pardo, E. Starikov, P. Shiktorov and V. Gružinskis
Microelectronics Journal, Vol.28(2), pp.183-198
02/1997
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