- Title
- Monte Carlo Simulations to Evaluate the Contribution of Si Bulk, Interconnects, and Packaging to Alpha-Soft Error Rates in Advanced Technologies
- Creators - without role
- M. Gedion - Université de Montpellier, Institut d'Electronique et des Systèmes - IESFrédéric Wrobel - Université de Montpellier, Institut d'Electronique et des Systèmes - IESFrédéric Saigné - Université de Montpellier, Institut d'Electronique et des Systèmes - IESR. D. Schrimpf - Vanderbilt UniversityJ. Mekki - European Organization for Nuclear Research
- Publication Details
- IEEE Transactions on Nuclear Science
- Identifiers
- 9943863009311
- Academic Unit
- Institut d'Electronique et des Systèmes - IES
- Language
- English
- Resource Type
- Journal article
- Local Fields
- hal-01632367
Journal article
Monte Carlo Simulations to Evaluate the Contribution of Si Bulk, Interconnects, and Packaging to Alpha-Soft Error Rates in Advanced Technologies
IEEE Transactions on Nuclear Science
12/2010
Metrics
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