Monolithically Integrated Diode Laser Detection System for Scanning Near-Field Optical Microscopy (SNOM) : VCSEL Technology

Article de revue

Sabry Khalfallah, Jean Podlecki, Masao Nishioka, Christophe Gorecki, Hideki Kawakatsu, Fujita Hiroyuki, Takao Someya et Yasuhiko Arakawa

Seisan Kenkyu, Vol.51(8), pp.634-637

1999

Résumé

Electronics

Engineering Sciences

Micro and nanotechnologies

Microelectronics

Optics

Photonic

1 Consultations de la notice

Titre: Monolithically Integrated Diode Laser Detection System for Scanning Near-Field Optical Microscopy (SNOM) : VCSEL Technology
Créateurs - sans rôle: Sabry Khalfallah
Jean Podlecki - Laboratory for Integrated Micro Mechatronics Systems
Masao Nishioka
Christophe Gorecki
Hideki Kawakatsu
Fujita Hiroyuki
Takao Someya
Yasuhiko Arakawa
Détails de publication: Seisan Kenkyu, Vol.51(8), pp.634-637
Nombre de pages: 4
Identifiants: 99162625309311
Unité académique: Institut d'Electronique et des Systèmes - IES
Langue: English
Type de ressource: Journal article