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Molecular beam epitaxy and characterization of high Bi content GaSbBi alloys
Journal article   Peer reviewed

Molecular beam epitaxy and characterization of high Bi content GaSbBi alloys

Olivier Delorme, Laurent Cerutti, Jean-Baptiste Rodriguez and Eric Tournié
Journal of Crystal Growth, Vol.477, pp.144-148
01/11/2017

Abstract

Semiconducting III-V materials GaSbBi X-ray diffraction Molecular beam epitaxy
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