Modeling low-dose-rate effects in irradiated bipolar-base oxides

Journal article

Peer reviewed

R.J. Graves, C.R. Cirba, R.D. Schrimpf, R.J. Milanowski, A. Michez, D.M. Fleetwood, S.C. Witczak and Frédéric Saigné

IEEE Transactions on Nuclear Science, Vol.45(6), pp.2352 - 2360

1998

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Title: Modeling low-dose-rate effects in irradiated bipolar-base oxides
Creators - without role: R.J. Graves - Vitalant
C.R. Cirba - Vanderbilt University
R.D. Schrimpf - Vanderbilt University
R.J. Milanowski - Vanderbilt University
A. Michez - Université de Montpellier
D.M. Fleetwood - Sandia National Laboratories
S.C. Witczak - The Aerospace Corporation
Frédéric Saigné - Université de Montpellier
Publication Details: IEEE Transactions on Nuclear Science, Vol.45(6), pp.2352 - 2360
Identifiers: 9946578509311
Academic Unit: Université de Montpellier
Language: English
Resource Type: Journal article
Local Fields: hal-01801597