- Title
- Mechanical properties of SiC nanowires determined by scanning electron and field emission microscopies
- Creators - without role
- S. Perisanu - Université Claude Bernard Lyon 1V. Gouttenoire - Université Claude Bernard Lyon 1P. Vincent - Université Claude Bernard Lyon 1A. Ayari - Université Claude Bernard Lyon 1M. Choueib - Université Claude Bernard Lyon 1Mikhael Bechelany - Université de Montpellier, Institut Européen des Membranes - IEMD. Cornu - Université de Montpellier, Institut Européen des Membranes - IEMS. Purcell - Université Claude Bernard Lyon 1
- Publication Details
- Physical Review B: Condensed Matter and Materials Physics (1998-2015), Vol.77(16)
- Identifiers
- 9936932009311
- Academic Unit
- Institut Européen des Membranes - IEM
- Language
- English
- Resource Type
- Journal article
- Local Fields
- hal-01701887
Journal article
Mechanical properties of SiC nanowires determined by scanning electron and field emission microscopies
Physical Review B: Condensed Matter and Materials Physics (1998-2015), Vol.77(16)
04/2008
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