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Low frequency noise in InAlAs/InGaAs modulation doped field effect transistors with 50-nm gate length
Journal article   Open access   Peer reviewed

Low frequency noise in InAlAs/InGaAs modulation doped field effect transistors with 50-nm gate length

M.E. Levinshtein, S.L. Rumyantsev, R. Tauk, S. Boubanga, N. Dyakonova, W. Knap, A. Shchepetov, S. Bollaert, Yannick Roelens and M.S. Shur
Journal of Applied Physics, Vol.102(6)
2007
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