Layout-Aware Pattern Evaluation and Analysis for Power-Safe Application of TDF Patterns

Journal article

Peer reviewed

Patrick Girard, Mohammad Tehranipoor, Hassan Salmani, Wei Zhao and Xiaoqing Wen

Journal of Low Power Electronics, Vol.8(2), pp.248-258

04/2012

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Title: Layout-Aware Pattern Evaluation and Analysis for Power-Safe Application of TDF Patterns
Creators - without role: Patrick Girard - Conception et Test de Systèmes MICroélectroniques
Mohammad Tehranipoor - University of Connecticut
Hassan Salmani - University of Connecticut
Wei Zhao - University of Connecticut
Xiaoqing Wen - Kyushu Institute of Technology
Publication Details: Journal of Low Power Electronics, Vol.8(2), pp.248-258
Identifiers: 9942676909311
Academic Unit: Laboratoire d'Informatique de Robotique et de Microélectronique de Mtp - LIRMM
Language: English
Resource Type: Journal article
Local Fields: lirmm-00816606