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Langevin forces and generalized transfer fields for noise modeling in deep submicron devices
Journal article   Peer reviewed

Langevin forces and generalized transfer fields for noise modeling in deep submicron devices

P. Shiktorov, E. Starikov, V. Gruzinskis, T. Gonzalez, J. Mateos, D. Pardo, L. Reggiani, L. Varani and J.-C. Vaissiere
IEEE Transactions on Electron Devices, Vol.47(10), pp.1992-1998
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