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LET Calibration of Ion Microbeams and Their SEE Cross Section Characterization
Article de revue   Avec comité de lecture

LET Calibration of Ion Microbeams and Their SEE Cross Section Characterization

Stefania Peracchi, Ryan Drury, Zeljko Pastuovic, Jesse Williams, Linh T. Tran, Susanna Guatelli, Vladimir Pan, Jay W. Archer, Anatoly B. Rosenfeld, Andrea Coronetti, …
IEEE transactions on nuclear science, Vol.71(8), pp.1565-1570
01/08/2024

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Engineering Engineering, Electrical & Electronic Nuclear Science & Technology Science & Technology Technology

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