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Joined Ellipsometry and Voltametry Investigation on the Second Discharge Plateau in Ni(OH)(2)
Article de revue   Avec comité de lecture

Joined Ellipsometry and Voltametry Investigation on the Second Discharge Plateau in Ni(OH)(2)

F. Fourgeot, S. Deabate, F. Henn et M. Costa
Ionics, Vol.6(5-6), pp.364-368
01/09/2000

Résumé

Chemistry Chemistry, Physical Electrochemistry Physical Sciences Physics Physics, Condensed Matter Science & Technology

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